I06 Aberration Corrected PEEM/LEEM Microscope

Description

Our technical specification details the requirements of the Aberration Corrected PhotoEmission Electron Microscope (AC-PEEM) and Low Energy Electron Microscope (AC-LEEM) for use on the Nanoscience beamline at DLS. The microscope will be installed on the nanoscience I06 beamline that is dedicated to the study of nanomagnetism and nanostructures using element specific probes such as X-Ray absorption spectroscopy and X-Ray photoelectron spectroscopy. The variable polarisation state of the x-ray light provides a contrast mechanism for imaging different magnetisation states in ferromagnetic and anti-ferromagnetic nanostructures. The contractor will be responsible for the supply of materials, manufacture, inspection, cleaning, testing, vacuum baking, assembly, packing, delivery and installation at DLS of the AC-PEEM/LEEM complete microscope. Additional information: If you are interested in this tender opportunity please create an account via the website link below: http://www.diamond.ac.uk/Home/Procurement/ You will then be issued with a password to download the tender documents. In order to be considered, your response should arrive no later than midnight on Tuesday 8.1.2019. Details of the evaluation criteria for this tender are included in the OJEU Notice attached. Please note: Diamond will be closed for the Christmas Break from Friday 21.12.2018 to Tuesday 1.1.2019. Any communication with us during this period will not be dealt with until Wednesday 2.1.2019.

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