Scanning Microwave Microscope

Description

The requirement is for a scanning microwave impedance microscope capable of performing functional imaging on a nanometre scale resolution. The requested functionalities include scattering at a broadband terahertz range, surface voltage mapping (Kelvin probe), and local conduction and / or impedance. The instrument must include an environmental chamber, suitable for working in low vacuum or under inert ambience and accommodate samples of at least 50mm in diameter. The opportunity can be viewed using the following link: http://events.transaxions.com/service.aspx?event=6802

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